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Impact of the free electron distribution on the random telegraph signal capture kinetics in submicron n-metal-oxide-semiconductor field-effect transistors
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Impact of the free electron distribution on the random telegraph signal capture kinetics in submicron n-metal-oxide-semiconductor field-effect transistors
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N. B.
;
Petrichuk, M. V.
;
Garbar, N. P.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Applied Physics Letters
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1885
since deposited on 2021-10-01
Acq. date: 2025-12-11
Citations
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Views
1885
since deposited on 2021-10-01
Acq. date: 2025-12-11
Citations