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E-beam metrology-based EUVL aberration monitoring
Publication:
E-beam metrology-based EUVL aberration monitoring
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2615955
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kang, Seulki
;
Miura, Yuji
;
Maruyama, Kotaro
;
Yamazaki, Yuichiro
;
Wei, Chih-, I
;
Maguire, Ethan
;
Fenger, Germain
;
De Bisschop, Peter
;
Das, Sayantan
;
Halder, Sandip
;
Lorusso, Gian
Journal
Proceedings of SPIE
Abstract
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1278
since deposited on 2022-09-08
Acq. date: 2025-10-26
Citations
Metrics
Views
1278
since deposited on 2022-09-08
Acq. date: 2025-10-26
Citations