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Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations
Publication:
Measurement and modeling of the sensitivity of LC-VCO's to substrate noise perturbations
Date
2007-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bronckers, Stephane
;
Vandersteen, Gerd
;
Soens, Charlotte
;
Van der Plas, Geert
;
Rolain, Yves
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Abstract
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1913
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1913
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations