Publication:
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal gate pMOSFETs
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1908 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-14
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Views
1908 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-14
Citations