Publication:
Generation of hole traps in silicon dioxides
Date
| dc.contributor.author | Zhang, Jenny | |
| dc.contributor.author | Sii, H. K. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.date.accessioned | 2021-10-14T18:30:38Z | |
| dc.date.available | 2021-10-14T18:30:38Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5867 | |
| dc.source.beginpage | 50 | |
| dc.source.conference | Proceedings of the 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 54 | |
| dc.title | Generation of hole traps in silicon dioxides | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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