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A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes
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2082 since deposited on 2021-10-15
Acq. date: 2025-10-23
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Views
2082 since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations