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High temperature calibration of a compact model for GaN-on-Si power switches

Date

2011
Proceedings Paper
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dc.contributor.authorStoffels, Steve
dc.contributor.authorMarcon, Denis
dc.contributor.authorGeens, Karen
dc.contributor.authorKang, Xuanwu
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-19T19:19:27Z
dc.date.available2021-10-19T19:19:27Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19844
dc.source.beginpage159
dc.source.conferenceInternational Workshopon on Thermal Investigations of ICs and Systems - Therminic
dc.source.conferencedate27/09/2011
dc.source.conferencelocationParis France
dc.source.endpage163
dc.title

High temperature calibration of a compact model for GaN-on-Si power switches

dc.typeProceedings paper
dspace.entity.typePublication
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