Publication:
Tunnelling 1/fy noise in 5nm HfO2/2.1 nm SiO2 gate stack n-MOSFETs
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1885 since deposited on 2021-10-15
Acq. date: 2025-12-15
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1885 since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations