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Critical processes for ultra-thin gate oxide integrity
Publication:
Critical processes for ultra-thin gate oxide integrity
Date
1996
Proceedings Paper
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1179.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Depas, Michel
;
Heyns, Marc
;
Nigam, Tanya
;
Kenis, Karine
;
Sprey, Hessel
;
Wilhelm, H.
;
Wilhelm, Rudi
;
Crossley, A.
;
Sofield, C. J.
;
Gräf, D.
Journal
Abstract
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1982
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1982
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations