Publication:

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate

Date

2016

Journal article

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Author(s)

Meneghesso, Gaudenzio

;

Meneghini, Matteo

;

;

Rossetto, Isabella

;

;

Van Hove, Marleen

;

;

Stoffels, Steve

;

Decoutere, Stefaan

;

Journal

Microelectronics Reliability

Metrics

1904 since deposited on 2021-10-23

Acq. date: 2025-12-13