Publication:
Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1912 since deposited on 2021-10-23
3last month
1last week
Acq. date: 2026-08-08
Citations
Statistics
Views
1912 since deposited on 2021-10-23
3last month
1last week
Acq. date: 2026-08-08
Citations