Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point
Publication:
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point
Copy permalink
Date
2017
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
37421.pdf
200.36 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Noltsis, Michalis
;
Maragkoudaki, Eleni
;
Rodopoulos, Dimitrios
;
Catthoor, Francky
;
Soudris, Dimitrios
Journal
Abstract
Description
Metrics
Views
1954
since deposited on 2021-10-24
Acq. date: 2025-12-11
Citations
Metrics
Views
1954
since deposited on 2021-10-24
Acq. date: 2025-12-11
Citations