Publication:

Radiation damage in deep submicron partially depleted SOI CMOS

Date

2003
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSerra-Gallifa, Xavier
dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.authorKokkoris, M.
dc.contributor.authorKossionides, E.
dc.contributor.authorFanourakis, G.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.accessioned2021-10-15T06:43:26Z
dc.date.available2021-10-15T06:43:26Z
dc.date.embargo9999-12-31
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8156
dc.source.beginpage437
dc.source.conferenceSilicon-on-Insulator Technology and Devices XI
dc.source.conferencedate28/04/2003
dc.source.conferencelocationParis France
dc.source.endpage442
dc.title

Radiation damage in deep submicron partially depleted SOI CMOS

dc.typeProceedings paper
dspace.entity.typePublication
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