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Origin of the deep reset and low variability of pulse-programmed W\Al2O3\TiW\Cu CBRAM device

Date

2014
Proceedings Paper
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dc.contributor.authorBelmonte, Attilio
dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorKim, Woosik
dc.contributor.authorHoussa, Michel
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGoux, Ludovic
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-22T00:45:47Z
dc.date.available2021-10-22T00:45:47Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23534
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6849356&contentType=Conference+Publications
dc.source.conferenceIEEE 6th International Memory Workshop - IMW
dc.source.conferencedate18/05/2014
dc.source.conferencelocationTaipei Taiwan
dc.title

Origin of the deep reset and low variability of pulse-programmed W\Al2O3\TiW\Cu CBRAM device

dc.typeProceedings paper
dspace.entity.typePublication
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