Publication:
ESD reliability of FinFETs and 3D ICs
Date
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2021-10-22T20:37:34Z | |
| dc.date.available | 2021-10-22T20:37:34Z | |
| dc.date.issued | 2015-07 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25565 | |
| dc.source.beginpage | 1 | |
| dc.source.conference | EOSESD Symposium Asia | |
| dc.source.conferencedate | 1/07/2015 | |
| dc.source.conferencelocation | Seoul South Korea | |
| dc.source.endpage | 3 | |
| dc.title | ESD reliability of FinFETs and 3D ICs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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