Publication:

Understanding the impact of time-dependent random variability on analog ICs: from single transistor measurements to circuit simulations

Date

2019
Journal article
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dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorParvais, Bertrand
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKaczer, Ben
dc.contributor.authorGielen, Georges
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-27T18:18:43Z
dc.date.available2021-10-27T18:18:43Z
dc.date.issued2019
dc.identifier.issn1063-8210
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34004
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8556027
dc.source.beginpage601
dc.source.endpage610
dc.source.issue3
dc.source.journalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.volume27
dc.title

Understanding the impact of time-dependent random variability on analog ICs: from single transistor measurements to circuit simulations

dc.typeJournal article
dspace.entity.typePublication
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