Publication:

Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias

Date

2013
Proceedings Paper
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dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorSchwarz, Benedikt
dc.contributor.authorBina, Markus
dc.contributor.authorWaltl, Michael
dc.contributor.authorWagner, Paul-Juergen
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-21T07:42:15Z
dc.date.available2021-10-21T07:42:15Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22364
dc.source.beginpage2D.3
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate14/04/2013
dc.source.conferencelocationMonterey, CA USA
dc.title

Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias

dc.typeProceedings paper
dspace.entity.typePublication
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