Publication:
Characterisation of reliability of compound semiconductor devices using electrical pulses
Date
| dc.contributor.author | Brandt, M. | |
| dc.contributor.author | Krozer, V. | |
| dc.contributor.author | Schuessler, M. | |
| dc.contributor.author | Bock, Karlheinz | |
| dc.contributor.author | Hartnagel, H. L. | |
| dc.date.accessioned | 2021-09-29T14:18:01Z | |
| dc.date.available | 2021-09-29T14:18:01Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1104 | |
| dc.source.beginpage | 1891 | |
| dc.source.endpage | 1894 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 36 | |
| dc.title | Characterisation of reliability of compound semiconductor devices using electrical pulses | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |