Publication:
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling
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1903 since deposited on 2021-10-19
1last month
Acq. date: 2026-08-28
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Statistics
Views
1903 since deposited on 2021-10-19
1last month
Acq. date: 2026-08-28
Citations