Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device

dc.contributor.author	Verspecht, J.
dc.contributor.author	Debie, Peter
dc.contributor.author	Martens, Luc
dc.contributor.author	Barel, A.
dc.contributor.imecauthor	Martens, Luc
dc.date.accessioned	2021-09-29T15:49:42Z
dc.date.available	2021-09-29T15:49:42Z
dc.date.embargo	9999-12-31
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1638
dc.source.beginpage	35
dc.source.endpage	45
dc.source.issue	2
dc.source.journal	HF Revue - HF Tijdschrift
dc.title	Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device
dc.type	Journal article
dspace.entity.type	Publication
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