Understanding the potential and the limits of germanium pMOSFETs for VLSI circuits from experimental measurements

dc.contributor.author	Magnone, P.
dc.contributor.author	Crupi, Felice
dc.contributor.author	Alioto, M.
dc.contributor.author	Kaczer, Ben
dc.contributor.author	De Jaeger, Brice
dc.contributor.imecauthor	Kaczer, Ben
dc.contributor.imecauthor	De Jaeger, Brice
dc.contributor.orcidimec	Kaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimec	De Jaeger, Brice::0000-0001-8804-7556
dc.date.accessioned	2021-10-19T15:51:22Z
dc.date.available	2021-10-19T15:51:22Z
dc.date.embargo	9999-12-31
dc.date.issued	2011
dc.identifier.issn	1063-8210
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/19354
dc.identifier.url	http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5508322
dc.source.beginpage	1569
dc.source.endpage	1582
dc.source.issue	9
dc.source.journal	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.volume	19
dc.title	Understanding the potential and the limits of germanium pMOSFETs for VLSI circuits from experimental measurements
dc.type	Journal article
dspace.entity.type	Publication
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