Deep level studies in high-temperature annealed silicon wafers for layer transfer in thin-film solar cells

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Depauw, Valerie
dc.contributor.author	Gordon, Ivan
dc.contributor.author	Poortmans, Jef
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Depauw, Valerie
dc.contributor.imecauthor	Gordon, Ivan
dc.contributor.imecauthor	Poortmans, Jef
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimec	Depauw, Valerie::0000-0003-2045-9698
dc.contributor.orcidimec	Gordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimec	Poortmans, Jef::0000-0003-2077-2545
dc.date.accessioned	2021-10-20T16:10:09Z
dc.date.available	2021-10-20T16:10:09Z
dc.date.issued	2012
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/21514
dc.source.beginpage	1857
dc.source.conference	E-MRS Spring Meeting Symposium A
dc.source.conferencedate	14/05/2012
dc.source.conferencelocation	Straatsburg France
dc.source.endpage	1860
dc.source.issue	10
dc.source.journal	Physica Status Solidi A
dc.source.volume	209
dc.title	Deep level studies in high-temperature annealed silicon wafers for layer transfer in thin-film solar cells
dc.type	Journal article
dspace.entity.type	Publication
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