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Articles
Performance degradation of RF circuits due to impact of digital switching noise
Publication:
Performance degradation of RF circuits due to impact of digital switching noise
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Soens, Charlotte
;
Van der Plas, Geert
;
Wambacq, Piet
;
Donnay, Stephane
;
Kuijk, Maarten
;
Barel, A.
Journal
Belgian Journal of Electronics and Communication - Sitel Journal
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1935
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations
Metrics
Views
1935
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations