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Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire

Date

1998
Journal article
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dc.contributor.authorO'Donnell, K. P.
dc.contributor.authorMiddleton, P. G.
dc.contributor.authorTrager-Cowan, C.
dc.contributor.authorYoung, C.
dc.contributor.authorBayliss, S. C.
dc.contributor.authorFletcher, I.
dc.contributor.authorVan der Stricht, Wim
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorDemeester, Piet
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.imecauthorDemeester, Piet
dc.date.accessioned2021-10-01T08:34:35Z
dc.date.available2021-10-01T08:34:35Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2814
dc.source.beginpage3273
dc.source.endpage3275
dc.source.issue22
dc.source.journalApplied Physics Letters
dc.source.volume73
dc.title

Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire

dc.typeJournal article
dspace.entity.typePublication
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