Publication:
Three dimensional compositional analysis of semiconductors with the Atom Probe
Date
| dc.contributor.author | Koelling, Sebastian | |
| dc.contributor.thesisadvisor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-19T14:55:05Z | |
| dc.date.available | 2021-10-19T14:55:05Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011-12 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19191 | |
| dc.title | Three dimensional compositional analysis of semiconductors with the Atom Probe | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |