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Electron traps at sidewalls of vertical n+-GaAs/n--InGaP/p+-GaAs diodes detected with deep-level transient spectroscopy
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Electron traps at sidewalls of vertical n+-GaAs/n--InGaP/p+-GaAs diodes detected with deep-level transient spectroscopy
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Date
2019-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yu, Hao
;
Hsu, Brent
;
Vais, Abhitosh
;
Simoen, Eddy
;
Waldron, Niamh
;
Collaert, Nadine
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1927
since deposited on 2021-10-28
Acq. date: 2025-12-15
Citations
Metrics
Views
1927
since deposited on 2021-10-28
Acq. date: 2025-12-15
Citations