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Nanoindentation based method to determine the thermal expansion coefficients of low-k dielectrics
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Nanoindentation based method to determine the thermal expansion coefficients of low-k dielectrics
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Date
2022-10-01
Journal article
https://doi.org/10.1016/j.tsf.2022.139467
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanstreels, Kris
;
Gonzalez, Mario
;
Salahouelhadj, Abdellah
Journal
Thin Solid Films
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3
since deposited on 2022-09-22
Acq. date: 2026-01-10
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1561
since deposited on 2022-09-22
2
last month
Acq. date: 2026-01-10
Citations
Metrics
Downloads
3
since deposited on 2022-09-22
Acq. date: 2026-01-10
Views
1561
since deposited on 2022-09-22
2
last month
Acq. date: 2026-01-10
Citations