Publication:

Analysis of selectively grown epitaxial Si1-xGex by spectroscopic ellipsometry and comparison with RBS and SIMS

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1912 since deposited on 2021-10-14
Acq. date: 2026-10-05

Citations

Statistics

Views

1912 since deposited on 2021-10-14
Acq. date: 2026-10-05

Citations