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Using ellipsometry for assessment of TiN surface roughness after plasma etch
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Using ellipsometry for assessment of TiN surface roughness after plasma etch
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shamiryan, Denis
;
Paraschiv, Vasile
;
Dictus, Dries
;
Baklanov, Mikhaïl
;
Beckx, Stephan
;
Boullart, Werner
Journal
Journal of the Electrochemical Sosiety
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1862
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Acq. date: 2025-12-16
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1862
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-16
Citations