Publication:

The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As

Date

2019
Journal article
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dc.contributor.authorHsu, Brent
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMerckling, Clement
dc.contributor.authorEneman, Geert
dc.contributor.authorMols, Yves
dc.contributor.authorHan, Han
dc.contributor.authorAlian, AliReza
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorHan, Han
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecHan, Han::0000-0003-2169-8332
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-27T10:34:19Z
dc.date.available2021-10-27T10:34:19Z
dc.date.issued2019
dc.identifier.issn0022-3727
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33172
dc.identifier.urlhttps://doi.org/10.1088/1361-6463/ab3eca
dc.source.beginpage485102
dc.source.issue48
dc.source.journalJournal of Physics D: Applied Physics
dc.source.volume52
dc.title

The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As

dc.typeJournal article
dspace.entity.typePublication
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