Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAs
Publication:
Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAs
Date
2014
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Kaczer, Ben
;
Roussel, Philippe
;
Cho, Moon Ju
;
Grasser, Tibor
;
Arimura, Hiroaki
;
Cott, Daire
;
Mitard, Jerome
;
Witters, Liesbeth
;
Waldron, Niamh
;
Zhou, Daisy
;
Alian, AliReza
;
Vais, Abhitosh
;
Lin, Dennis
;
Martens, Koen
;
Pourghaderi, Mohammad Ali
;
Sioncke, Sonja
;
Collaert, Nadine
;
Thean, Aaron
;
Heyns, Marc
;
Groeseneken, Guido
Journal
Abstract
Description
Metrics
Views
1912
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1912
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations