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Evidence and characterization of crystallographic defect and material quality after SLIM-cut process
Publication:
Evidence and characterization of crystallographic defect and material quality after SLIM-cut process
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Masolin, Alex
;
Vaes, Jan
;
Dross, Frederic
;
Pesquera, Amaia
;
Poortmans, Jef
;
Mertens, Robert
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1918
since deposited on 2021-10-19
Acq. date: 2026-01-08
Citations
Metrics
Views
1918
since deposited on 2021-10-19
Acq. date: 2026-01-08
Citations