Publication:
The mechanisms of hot carrier degradation and oxide breakdown in submicron CMOS techmologies
Date
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-06T11:13:58Z | |
| dc.date.available | 2021-10-06T11:13:58Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3474 | |
| dc.source.conference | 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits; July 1999; Singapore. | |
| dc.title | The mechanisms of hot carrier degradation and oxide breakdown in submicron CMOS techmologies | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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