Publication:

Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

Date

2021
Journal article
https://doi.org/10.1063/5.0046305
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dc.contributor.authorShlyakhov, Ilya
dc.contributor.authorIakoubovskii, K.
dc.contributor.authorBanerjee, Sreetama
dc.contributor.authorGaur, Abhinav
dc.contributor.authorLin, Dennis
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorRadu, Iuliana
dc.contributor.authorChai, J.
dc.contributor.authorYang, M.
dc.contributor.authorWang, S. J.
dc.contributor.authorHoussa, Michel
dc.contributor.authorStesmans, A.
dc.contributor.authorAfanas'ev, V.
dc.contributor.imecauthorShlyakhov, Ilya
dc.contributor.imecauthorGaur, Abhinav
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidextShlyakhov, I.::0000-0003-0845-910X
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.date.accessioned2021-12-08T11:31:21Z
dc.date.available2021-11-02T16:02:40Z
dc.date.available2021-12-08T11:31:21Z
dc.date.issued2021
dc.identifier.doi10.1063/5.0046305
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37997
dc.publisherAMER INST PHYSICS
dc.source.beginpage155302
dc.source.issue15
dc.source.journalJOURNAL OF APPLIED PHYSICS
dc.source.numberofpages8
dc.source.volume129
dc.title

Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

dc.typeJournal article
dspace.entity.typePublication
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