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Defect location identification for cell-aware test
Publication:
Defect location identification for cell-aware test
Date
2019-07
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, Zhan
;
Malagi, Santosh S.
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
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1914
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations