Machine learning for fast characterization of magnetic logic devices

dc.contributor.author	Kaintura, Arun
dc.contributor.author	Foss, Kyle
dc.contributor.author	Couckuyt, Ivo
dc.contributor.author	Dhaene, Tom
dc.contributor.author	Zografos, Odysseas
dc.contributor.author	Vaysset, Adrien
dc.contributor.author	Soree, Bart
dc.contributor.imecauthor	Couckuyt, Ivo
dc.contributor.imecauthor	Dhaene, Tom
dc.contributor.imecauthor	Zografos, Odysseas
dc.contributor.imecauthor	Soree, Bart
dc.contributor.orcidimec	Couckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimec	Dhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimec	Zografos, Odysseas::0000-0002-9998-8009
dc.contributor.orcidimec	Soree, Bart::0000-0002-4157-1956
dc.date.accessioned	2021-10-25T20:35:17Z
dc.date.available	2021-10-25T20:35:17Z
dc.date.embargo	9999-12-31
dc.date.issued	2018
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/30995
dc.identifier.url	https://ieeexplore.ieee.org/document/8680898
dc.source.beginpage	1
dc.source.conference	IEEE Electrical Design of Advanced Packaging and Systems Symposium - EDAPS
dc.source.conferencedate	16/12/2018
dc.source.conferencelocation	Chandigarh India
dc.source.endpage	3
dc.title	Machine learning for fast characterization of magnetic logic devices
dc.type	Proceedings paper
dspace.entity.type	Publication
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