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"Self-Focusing – SIMS" : composition analysis of thin films beyond the lateral resolution
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"Self-Focusing – SIMS" : composition analysis of thin films beyond the lateral resolution
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franquet, Alexis
;
Douhard, Bastien
;
Conard, Thierry
;
Vandervorst, Wilfried
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1817
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Acq. date: 2025-12-15
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Metrics
Views
1817
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations