Publication:

Investigation of radiation damage of Cu plated IBC cells caused by sputtering of SEED layer

Date

2016
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dc.contributor.authorSingh, Sukhvinder
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorJambaldinni, Shruti
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorSingh, Sukhvinder
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorJambaldinni, Shruti
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecSingh, Sukhvinder::0000-0003-1985-0534
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-23T15:01:52Z
dc.date.available2021-10-23T15:01:52Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27326
dc.identifier.urlhttp://www.metallizationworkshop.info/fileadmin/metallizationworkshop/favicon/3.4_Sukhvinder_Metalization-workshop.pdf
dc.source.conference6th Workshop on Metallization & Interconnection for Crystalline Silicon Solar Cells
dc.source.conferencedate2/05/2016
dc.source.conferencelocationKonstanz Germany
dc.title

Investigation of radiation damage of Cu plated IBC cells caused by sputtering of SEED layer

dc.typeOral presentation
dspace.entity.typePublication
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