Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs

Publication:

1999

Journal article

Author(s)

Henson, W. K.

;

Yang, N.

;

Wortman, J. J.

IEEE Electron Device Letters

1988 since deposited on 2021-10-06

Acq. date: 2026-02-04