Publication:

Extended defects created by helium implantation at different temperature in germanium

Date

2008
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dc.contributor.authorRousselet, S.
dc.contributor.authorDavid, M.L.
dc.contributor.authorBeaufort, M.F.
dc.contributor.authorPailloux, F.
dc.contributor.authorBarbot, J.F.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T10:19:43Z
dc.date.available2021-10-17T10:19:43Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14400
dc.source.conferenceInternational Conference on Extended Defects in Semiconductors - EDS
dc.source.conferencedate14/09/2008
dc.source.conferencelocationPoitiers France
dc.title

Extended defects created by helium implantation at different temperature in germanium

dc.typeOral presentation
dspace.entity.typePublication
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