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Analysis of transferred MoS2 layers grown by MOCVD: evidence of Mo vacancy related defect formation
Publication:
Analysis of transferred MoS2 layers grown by MOCVD: evidence of Mo vacancy related defect formation
Date
2020
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schoenaers, Ben
;
Leonhardt, Alessandra
;
Nalin Mehta, Ankit
;
Stesmans, Andre
;
Chiappe, Daniele
;
Asselberghs, Inge
;
Radu, Iuliana
;
Huyghebaert, Cedric
;
De Gendt, Stefan
;
Houssa, Michel
;
Afanas'ev, Valeri V.
Journal
ECS Journal of Solid State Science and Technology
Abstract
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1971
since deposited on 2021-10-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1971
since deposited on 2021-10-29
Acq. date: 2025-10-23
Citations