Publication:

Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design

Date

2025-JUN 17
Journal article
https://doi.org/10.1109/TED.2025.3578553
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dc.contributor.authorLorenzelli, Francesco
dc.contributor.authorChen, Kuan-Chu
dc.contributor.authorGodfrin, Clement
dc.contributor.authorStucchi, Michele
dc.contributor.authorGrill, Alexander
dc.contributor.authorWan, Danny
dc.contributor.authorDe Greve, Kristiaan
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGielen, Georges
dc.contributor.imecauthorLorenzelli, Francesco
dc.contributor.imecauthorChen, Kuan-Chu
dc.contributor.imecauthorGodfrin, Clement
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorWan, Danny
dc.contributor.imecauthorGreve, Kristiaan De
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecLorenzelli, Francesco::0000-0001-6465-7157
dc.contributor.orcidimecGodfrin, Clement::0000-0002-5244-3474
dc.contributor.orcidimecStucchi, Michele::0000-0002-7848-0492
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecWan, Danny::0000-0003-4847-3184
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2025-06-28T03:55:57Z
dc.date.available2025-06-28T03:55:57Z
dc.date.issued2025-JUN 17
dc.description.wosFundingTextThis work was supported in part by the Chips Joint Undertaking Project Advanced Research on Cryogenic Technologies for Innovative Computing (ARCTIC) under Project 101139908; in part by the Chips JU and Its Members (Including Top-Up Funding by Belgium, Austria, Germany, Estonia, Finland, France, Ireland, The Netherlands, and Sweden); and in part by European Union.
dc.identifier.doi10.1109/TED.2025.3578553
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45849
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4506
dc.source.endpage4514
dc.source.issue8
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages9
dc.source.volume72
dc.subject.keywordsFREEZE-OUT
dc.subject.keywordsQUANTUM
dc.title

Toward Wafer-Scale Screening of Spin Qubits: A Room-Temperature-Aware Single-Electron Transistor Design

dc.typeJournal article
dspace.entity.typePublication
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