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Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Publication:
Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hayama, K.
;
Rafi, J.M.
;
Takakura, K.
;
Ohyama, H.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
;
Kuboyama, S.
;
Oka, K.
;
Matsuda, S.
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1933
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1933
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations