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Influence of vacuum environment in conductive AFM measurements on advanced MOS gate dielectrics
Publication:
Influence of vacuum environment in conductive AFM measurements on advanced MOS gate dielectrics
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aguilera, Lidia
;
Polspoel, Wouter
;
Vandervorst, Wilfried
;
Nafria, Montserrat
;
Aymerich, Xavier
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1972
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-09
Citations
Metrics
Views
1972
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-09
Citations