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Composition influence on the physical and electrical properties of SrxTi1-xOy-based MIM capacitors prepared by Atomic Layer Deposition using TiN bottom electrodes
Publication:
Composition influence on the physical and electrical properties of SrxTi1-xOy-based MIM capacitors prepared by Atomic Layer Deposition using TiN bottom electrodes
Date
2009
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Menou, Nicolas
;
Popovici, Mihaela Ioana
;
Clima, Sergiu
;
Opsomer, Karl
;
Polspoel, Wouter
;
Kaczer, Ben
;
Rampelberg, Geert
;
Tomida, Kazuyuki
;
Pawlak, Malgorzata
;
Detavernier, Christophe
;
Pierreux, Dieter
;
Swerts, Johan
;
Maes, Jan Willem
;
Manger, Dirk
;
Badylevich, M
;
Afanasiev, Valeri
;
Conard, Thierry
;
Favia, Paola
;
Bender, Hugo
;
Brijs, Bert
;
Vandervorst, Wilfried
;
Van Elshocht, Sven
;
Pourtois, Geoffrey
;
Wouters, Dirk
;
Biesemans, Serge
;
Kittl, Jorge
Journal
Journal of Applied Physics
Abstract
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1973
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations
Metrics
Views
1973
since deposited on 2021-10-18
Acq. date: 2025-10-24
Citations