Publication:

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations

Date

2014
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorTang, Baojun
dc.contributor.authorZhang, Weidong
dc.contributor.authorBreuil, Laurent
dc.contributor.authorRobinson, Colin
dc.contributor.authorWang, Yunqi
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorZhang, Jianfu
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-22T06:24:22Z
dc.date.available2021-10-22T06:24:22Z
dc.date.issued2014
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24595
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414002832#
dc.source.beginpage2258
dc.source.endpage2261
dc.source.issue9_10
dc.source.journalMicroelectronics Reliability
dc.source.volume54
dc.title

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles