Publication:

Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters

 
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorLofrano, Melina
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.imecauthorLofrano, Melina
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLofrano, Melina::0000-0002-3930-6459
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.date.accessioned2023-06-29T13:47:39Z
dc.date.available2023-04-23T03:54:38Z
dc.date.available2023-06-29T13:47:39Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.description.wosFundingTextThis work was supported in part by the Cyber Security Research Flanders under Grant VR20192203.
dc.identifier.doi10.1109/LED.2022.3229137
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41480
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage201
dc.source.endpage204
dc.source.issue2
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.numberofpages4
dc.source.volume44
dc.title

Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters

dc.typeJournal article
dspace.entity.typePublication
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