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Accurate measurement and characterization of MCM-D integrated passives up to 50 GHz

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dc.contributor.authorCarchon, Geert
dc.contributor.authorBrebels, Steven
dc.contributor.authorVaesen, Kristof
dc.contributor.authorPieters, Philip
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorVandenberghe, S.
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorBeyne, Eric
dc.contributor.imecauthorBrebels, Steven
dc.contributor.imecauthorVaesen, Kristof
dc.contributor.imecauthorPieters, Philip
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecBrebels, Steven::0000-0002-1568-0286
dc.contributor.orcidimecVaesen, Kristof::0000-0001-9971-3593
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2021-10-14T12:42:59Z
dc.date.available2021-10-14T12:42:59Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4169
dc.source.beginpage307
dc.source.conferenceInternational Conference and Exhibition on High Density Interconnect and Systems Packaging - HDI
dc.source.conferencedate26/04/2000
dc.source.conferencelocationDenver, CO USA
dc.source.endpage312
dc.title

Accurate measurement and characterization of MCM-D integrated passives up to 50 GHz

dc.typeProceedings paper
dspace.entity.typePublication
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