Publication:

OxRRAM-Based Analog in-Memory Computing for Deep Neural Network Inference: A Conductance Variability Study

Date

2021
Journal article
https://doi.org/10.1109/TED.2021.3068696
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dc.contributor.authorDoevenspeck, Jonas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorCosemans, Stefan
dc.contributor.authorMallik, Arindam
dc.contributor.authorDebacker, Peter
dc.contributor.authorVerkest, Diederik
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorDehaene, Wim
dc.contributor.imecauthorDoevenspeck, Jonas
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2022-02-22T13:50:32Z
dc.date.available2022-02-22T13:50:32Z
dc.date.issued2021
dc.identifier.doi10.1109/TED.2021.3068696
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39015
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage2301
dc.source.endpage2305
dc.source.issue5
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages5
dc.source.volume68
dc.title

OxRRAM-Based Analog in-Memory Computing for Deep Neural Network Inference: A Conductance Variability Study

dc.typeJournal article
dspace.entity.typePublication
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