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The impact of back-side Cu contamination on 3D stacking architecture
Publication:
The impact of back-side Cu contamination on 3D stacking architecture
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yang, Yu
;
Labie, Riet
;
Richard, Olivier
;
Bender, Hugo
;
Zhao, Chao
;
Verlinden, Bert
;
De Wolf, Ingrid
Journal
Electrochemical and Solid-State Letters
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1859
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Views
1859
since deposited on 2021-10-19
3
last month
Acq. date: 2026-01-26
Citations