Publication:

A Comparative Study of In Situ Methodologies for Assessment of RF EMF Exposure From a 5G FR2 Base Station

Date

2024
Journal article
https://doi.org/10.1109/ACCESS.2024.3424262
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dc.contributor.authorGoegebeur, Samuel
dc.contributor.authorDeprez, Kenneth
dc.contributor.authorColombi, Davide
dc.contributor.authorBischoff, Jens Eilers
dc.contributor.authorDi Paola, Carla
dc.contributor.authorStroobandt, Bram
dc.contributor.authorVerloock, Leen
dc.contributor.authorAerts, Sam
dc.contributor.authorTornevik, Christer
dc.contributor.authorJoseph, Wout
dc.contributor.imecauthorGoegebeur, Samuel
dc.contributor.imecauthorDeprez, Kenneth
dc.contributor.imecauthorStroobandt, Bram
dc.contributor.imecauthorVerloock, Leen
dc.contributor.imecauthorJoseph, Wout
dc.contributor.orcidimecGoegebeur, Samuel::0000-0001-7527-2885
dc.contributor.orcidimecDeprez, Kenneth::0000-0002-1954-6738
dc.contributor.orcidimecStroobandt, Bram::0000-0003-2377-4300
dc.contributor.orcidimecVerloock, Leen::0000-0001-8392-3481
dc.contributor.orcidimecJoseph, Wout::0000-0002-8807-0673
dc.date.accessioned2024-11-19T08:51:19Z
dc.date.available2024-10-12T18:13:35Z
dc.date.available2024-11-19T08:51:19Z
dc.date.embargo2024-07-05
dc.date.issued2024
dc.identifier.doi10.1109/ACCESS.2024.3424262
dc.identifier.issn2169-3536
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44630
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage132552
dc.source.endpage132564
dc.source.issueN/A
dc.source.journalIEEE ACCESS
dc.source.numberofpages13
dc.source.volume12
dc.title

A Comparative Study of In Situ Methodologies for Assessment of RF EMF Exposure From a 5G FR2 Base Station

dc.typeJournal article
dspace.entity.typePublication
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